Probe tip characterizers
Probe tip characterizers are used to check the shape and the dimension of the probe tip. Each cell is numbered, which facilitates recalibration at the identical position.
IVPS100
IVPS100 - Improved Vertical Parallel Structure
Tip width characterizer with an array of 5 lines 100 nm wide.
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| IVPS100-1 | Material:Silicon  |
each | $26,832.07 |
IVPS100A
IVPS100A - Improved Vertical Parallel Structure
Tip width characterizer with an array of 5 lines 100 nm wide and a single line 100 nm wide for larger tips.
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| IVPS100A-1 | Material:Silicon |
each | $26,832.07 |
IVPS100-PTB
IVPS100-PTB - Improved Vertical Parallel Structure
Tip width characterizer with an array of 5 lines, line width varying from 50 nm to 130 nm in steps of 20 nm. Designed in collaboration with Physikalisch Technische Bundesanstalt, Braunschweig, Germany.
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| IVPS100-PTB-1 | Material:Silicon |
each | $26,832.07 |
ISNE
ISNE - Improved Silicon Nano Edge
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ISNE-1 | |
each | $26,832.07 |
I2FSR
I2FSR - Improved Flared Silicon Ridge
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| I2FSR-1 | |
each | $26,832.07 |